Wavelength-selective foreign matter inspection device
This is a wavelength-selective inspection device that switches to the optimal light (wavelength) for the inspection according to the sample being tested. A rich lineup tailored to the line configuration!
The FK Optical Research Institute's foreign matter inspection device is a wavelength-selective inspection device that switches to the optimal light (wavelength) for inspection based on the sample being inspected. It can uniformly illuminate at any wavelength. The optical design sufficiently suppresses stray light noise components for the inspection imaging sensor. Additionally, we offer a rich lineup that can be optimized for your production line configuration. 1. Area type that inspects glass substrates placed on the inspection stage using multiple area sensors. 2. Scan type that inspects glass substrates placed on the inspection stage by moving the foreign matter inspection machine to scan. 3. Conveyor type that inspects foreign matter on the surface of glass substrates being transported on a conveyor. 4. Backside foreign matter inspection type that inspects foreign matter on the underside of glass substrates being transported on a conveyor. *For more details, please refer to the PDF materials or feel free to contact us.
- Company：エフケー光学研究所
- Price：Other
